A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros. - Akira Yamazaki; Fukashi Morishita; Naoya Watanabe; Teruhiko Amano; Masaru Haraguchi; Hideyuki Noda; Atsushi Hachisuka; Katsumi Dosaka; Kazutami Arimoto; Setsuo Wake; Hideyuki Ozaki; Tsutomu Yoshihara (IEICE Trans. Electron., 2005)