System Informatics: From Methodology to Applications. - Kang Zhao 001; Yao Xie 002; Kwok-Leung Tsui; Qingming Wei; Wenpo Huang; Wei Jiang; Yanting Li; Su Gon Cho; Seoung Bum Kim; Kaibo Liu; Jianjun Shi 001; Young-Seon Jeong 001; et al. (IEEE Intell. Syst., 2015)

A generalised uncertain decision tree for defect classification of multiple wafer maps. - Byunghoon Kim; Young-Seon Jeong 001; Seung Hoon Tong; Myong K. Jeong (Int. J. Prod. Res., 2020)