A highly reliable multi-cell antifuse scheme using DRAM cell capacitors. - Jong-Pil Son; Jin Ho Kim; Woo Song Ahn; Seung Uk Han; Byung-Sick Moon; Churoo Park; Hong-Sun Hwang; Seong-Jin Jang; Joo-Sun Choi; Young-Hyun Jun; Soo-Won Kim (ESSCIRC, 2010)

An Area-Efficient, Low-VDD, Highly Reliable Multi-Cell Antifuse System Fully Operative in DRAMs. - Jong-Pil Son; Jin Ho Kim; Woo Song Ahn; Seung Uk Han; Satoru Yamada; Byung-Sick Moon; Churoo Park; Hong-Sun Hwang; Seong-Jin Jang; Joo-Sun Choi; Young-Hyun Jun; Soo-Won Kim (IEICE Trans. Electron., 2011)

The improvement of HEIP immunity using STI engineering at DRAM. - Seung Uk Han; Youngyoun Lee; Yongdoo Kim; Jemin Park; Junhee Lim; Satoru Yamada; Hyeongsun Hong; Kyupil Lee; Gyoyoung Jin; Eunseung Jung (Microelectron. Reliab., 2017)