Two-Dimensional Position Detection System with MEMS Accelerometer for MOUSE Applications. - Seungbae Lee; Gi-Joon Nam; Junseok Chae; Hanseup Kim; Alan J. Drake (DAC, 2001)

Series-resonant VHF micromechanical resonator reference oscillators. - Yu-Wei Lin; Seungbae Lee; Sheng-Shian Li; Yuan Xie; Zeying Ren; Clark T.-C. Nguyen (IEEE J. Solid State Circuits, 2004)

On the Filter Size of DMM for Passive Scalar in Complex Flow. - Yang Na; Dongshin Shin; Seungbae Lee (FSKD (1), 2005)

Two-dimensional position detection system with MEMS accelerometers, readout circuitry, and microprocessor for padless mouse applications. - Seungbae Lee; Gi-Joon Nam; Junseok Chae; Hanseup Kim; Alan J. Drake (IEEE Trans. Very Large Scale Integr. Syst., 2005)

Effect of Grid Resolution on the Statistics of Passive Scalar in an Injection-Driven Channel. - Yang Na; Dongshin Shin; Seungbae Lee (ICCSA (5), 2006)

Reliability and performance of IEEE 802.11n for vehicle networks with multiple nodes. - Seungbae Lee; Alvin S. Lim (ICNC, 2012)

An Empirical Study on Ad Hoc Performance of DSRC and Wi-Fi Vehicular Communications. - Seungbae Lee; Alvin S. Lim (Int. J. Distributed Sens. Networks, 2013)

Enabling actionable analytics for mobile devices: performance issues of distributed analytics on Hadoop mobile clusters. - Seungbae Lee; Kanika Grover; Alvin S. Lim (J. Cloud Comput., 2013)

CPI reliability and EMI benefit for MIM CAP embedded C4 package. - Hyunsuk Chun; In Hak Baick; Sangsu Ha; Eunmi Kwon; Seungbae Lee; Seil Kim; Sangwoo Pae; Jongwoo Park 001 (IRPS, 2015)

Efficient authentication approach for highly dynamic vehicular ad hoc networks. - Kanika Grover; Alvin S. Lim; Seungbae Lee (Int. J. Ad Hoc Ubiquitous Comput., 2015)

Privacy-Enabled Probabilistic Verification in Broadcast Authentication for Vehicular Networks. - Kanika Grover; Alvin S. Lim; Seungbae Lee; Qing Yang 003 (Ad Hoc Sens. Wirel. Networks, 2016)

The preferred type of tone-curve in a transparent OLED display. - Hyosun Kim; Young-Jun Seo; Seungbae Lee; Sung-Chan Jo; Youngshin Kwak (CIC, 2018)

Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. - Taiki Uemura; Soonyoung Lee; Dahye Min; Ihlhwa Moon; Jungman Lim; Seungbae Lee; Hyun-Chul Sagong; Sangwoo Pae (IRPS, 2018)

SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET. - Taiki Uemura; Soonyoung Lee; Dahye Min; Ihlhwa Moon; Seungbae Lee; Sangwoo Pae (IRPS, 2019)

Determining Ergonomic Smartphone Forms With High Grip Comfort and Attractive Design. - Songil Lee; Gyouhyung Kyung; Jihhyeon Yi; Donghee Choi; Sungryul Park; Byeonghwa Choi; Seungbae Lee (Hum. Factors, 2019)

Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Hai Jiang 005; Yongsung Ji; Tae-Young Jeong; Rakesh Ranjan; Seungbae Lee; Hwasung Rhee; Sangwoo Pae; Euncheol Lee; Jaehee Choi; et al. (IRPS, 2020)

Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Hai Jiang 005; Yongsung Ji; Tae-Young Jeong; Rakesh Ranjan; Youngin Park; Kiil Hong; Seungbae Lee; Hwasung Rhee; Sangwoo Pae; et al. (IRPS, 2020)

Shaping Rollable Display Devices: Effects of Gripping Condition, Device Thickness, and Hand Length on Bimanual Perceived Grip Comfort. - Songil Lee; Gyouhyung Kyung; Minjoong Kim; Donghee Choi; Hyeeun Choi; Kitae Hwang; Seonghyeok Park; Su Young Kim; Seungbae Lee (Hum. Factors, 2020)

Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Mijoung Kim; Dalhee Lee; Gunrae Kim; Seungbae Lee; Taesjoong Song; Hwasung Rhee; Brandon Lee; Jaehee Choi (IRPS, 2021)

Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. - Taiki Uemura; Byungjin Chung; Shin-Young Chung; Seungbae Lee; Yuchul Hwang; Sangwoo Pae (IRPS, 2023)

Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology. - Taiki Uemura; Byungjin Chung; Jaehee Choi; Seungbae Lee; Shin-Young Chung; Yuchul Hwang; Sangwoo Pae (IRPS, 2024)

Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence. - Taiki Uemura; Byungjin Chung; Jaehee Choi; Seungbae Lee; Shin-Young Chung; Yuchul Hwang; Sangwoo Pae (IRPS, 2024)