Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee 002; Rock-Hyun Baek (IEEE Access, 2019)

Bottom Oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee 002; Rock-Hyun Baek (IEEE Access, 2019)

Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node. - Jun-Sik Yoon; Seunghwan Lee 002; Junjong Lee; Jinsu Jeong; Hyeok Yun; Bohyeon Kang; Rock-Hyun Baek (IEEE Access, 2019)

Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application. - Jinsu Jeong; Jun-Sik Yoon; Seunghwan Lee 002; Rock-Hyun Baek (IEEE Access, 2020)

Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes. - Junjong Lee; Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee 002; Sanguk Lee; Rock-Hyun Baek (IEEE Access, 2021)

Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning. - Jun-Sik Yoon; Seunghwan Lee 002; Hyeok Yun; Rock-Hyun Baek (IEEE Access, 2021)

DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee 002; Junjong Lee; Sanguk Lee; Jaewan Lim; Rock-Hyun Baek (IEEE Access, 2022)

Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations. - Seunghwan Lee 002; Seungjoon Eom; Jinsu Jeong; Junjong Lee; Sanguk Lee; Hyeok Yun; Yonghwan Ahn; Rock-Hyun Baek (IEEE Access, 2024)

Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation. - Seungjoon Eom; Hyeok Yun; Hyundong Jang; Kyeongrae Cho; Seunghwan Lee 002; Jinsu Jeong; Rock-Hyun Baek (Adv. Intell. Syst., 2024)

Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring. - Hyeok Yun; Hyundong Jang; Seunghwan Lee 002; Junjong Lee; Kyeongrae Cho; Seungjoon Eom; Soomin Kim; Choong-Ki Kim; Hong-Chul Byun; Seongjoo Han; Min-Soo Yoo; Rock-Hyun Baek (Adv. Intell. Syst., 2024)

Patterned Multi-Wall Nanosheet FETs for Sustainable Scaling: Zero Gate Extension With Minimal Gate Cut Width. - Sanguk Lee; Jinsu Jeong; Jongseo Park; Seunghwan Lee 002; Junjong Lee; Yonghwan Ahn; Minchan Kim; Rock-Hyun Baek (IEEE Access, 2025)