Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. - Hyeok Yun; Chang-Hyeon An; Hyundong Jang; Kyeongrae Cho; Jeong-Sik Lee; Seungjoon Eom; Choong-Ki Kim; Min-Soo Yoo; Hyun-Chul Choi; Rock-Hyun Baek (Adv. Intell. Syst., 2023)

Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application. - Kyeongrae Cho; Jeong-Sik Lee; Chanyang Park; Hyeok Yun; Hyundong Jang; Seungjoon Eom; Min Sang Park; Hyun-Chul Choi; Rock-Hyun Baek (Adv. Intell. Syst., 2023)

Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations. - Seunghwan Lee; Seungjoon Eom; Jinsu Jeong; Junjong Lee; Sanguk Lee; Hyeok Yun; Yonghwan Ahn; Rock-Hyun Baek (IEEE Access, 2024)

Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation. - Seungjoon Eom; Hyeok Yun; Hyundong Jang; Kyeongrae Cho; Seunghwan Lee; Jinsu Jeong; Rock-Hyun Baek (Adv. Intell. Syst., 2024)

Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring. - Hyeok Yun; Hyundong Jang; Seunghwan Lee; Junjong Lee; Kyeongrae Cho; Seungjoon Eom; Soomin Kim; Choong-Ki Kim; Hong-Chul Byun; Seongjoo Han; Min-Soo Yoo; Rock-Hyun Baek (Adv. Intell. Syst., 2024)