Impact of electrode surface modulation on time-dependent dielectric breakdown. - Kong Boon Yeap; Tian Shen; Galor Wenyi Zhang; Sing Fui Yap; Brian Holt; Arfa Gondal; Seungman Choi; San Leong Liew; Walter Yao; Patrick Justison (IRPS, 2015)

Effect of metal line width on electromigration of BEOL Cu interconnects. - Seungman Choi; Cathryn Christiansen; Linjun Cao; James Zhang; Ronald Filippi; Tian Shen; Kong Boon Yeap; Sean P. Ogden; Haojun Zhang; Bianzhu Fu; Patrick Justison (IRPS, 2018)

Reliability challenges for 2.5D/3D integration: An overview. - C. S. Premachandran; Seungman Choi; Salvatore Cimino; Thuy Tran-Quinn; Lloyd Burrell; Patrick Justison (IRPS, 2018)

Robust BEOL MIMCAP for Long and Controllable TDDB Lifetime. - Lili Cheng; Seungman Choi; Sean P. Ogden; Teck Jung Tang; Robert Fox (IRPS, 2019)

Heuristic Evaluation for Augmentative and Alternative Communication Application: A Case Study. - Beom Young Jeong; Seungman Choi; Kyudong Park (ICTC, 2021)

Strategy to Characterize Electromigration Short Length Effects in Cu/low-k Interconnects. - Zhenjun Zhang; Matthias Kraatz; Meike Hauschildt; Seungman Choi; André Clausner; Ehrenfried Zschech; Martin Gall (IRPS, 2021)

Development of Bipolar Electrostatic Chuck with a Beam-Array Assembly Fabricated by Lithography. - Yuki Taoka; Kohei Kawabata; Pasomphone Hemthavy; Seungman Choi; Kunio Takahashi; Shigeki Saito (Int. J. Autom. Technol., 2022)

Nickel Silicide Electromigration on Micro Ring Modulators for Silicon Photonics Technology. - Brian T. McGowan; Michal Rakowski; Seungman Choi (IRPS, 2023)

Self-aligned Fiber Attach on Monolithic Silicon Photonic Chips: Moisture Effect and Hermetic Seal. - Zhuo-Jie Wu; Ping-Chuan Wang; Seungman Choi; Patrick Justison; Martin Gall; Jae Kyu Cho; Takako Hirokawa; Yusheng Bian; Thomas Houghton; Vaishnavi Karra; Dan Moy; Karen Nummy; et al. (OFC, 2023)

A Novel Method for the Determination of Electromigration-Induced Void Nucleation Stresses. - J. Shuster-Passage; S. Abdel Razek; M. Mattoo; Meike Hauschildt; Seungman Choi; Martin Gall; Armen Kteyan; Jun-Ho Choy; Valeriy Sukharev; Matthias Kraatz; J. R. Lloyd (IRPS, 2024)

A Unified Physics-Based Stochastic Model for EM-Induced Resistance Degradation in BEoL Interconnect Segments. - Valeriy Sukharev; Jun-Ho Choy; Armen Kteyan; J. Shuster-Passage; Seungman Choi; Martin Gall (IRPS, 2024)