Temperature dependence of NBTI induced delay. - Seyab Khan; Said Hamdioui (IOLTS, 2010)

NBTI Monitoring and Design for Reliability in Nanoscale Circuits. - Seyab Khan; Nor Zaidi Haron; Said Hamdioui; Francky Catthoor (DFT, 2011)

ReverseAge: An online NBTI combating technique using time borrowing. - Seyab Khan; Said Hamdioui (IDT, 2011)

Modeling and mitigating NBTI in nanoscale circuits. - Seyab Khan; Said Hamdioui (IOLTS, 2011)

BTI impact on logical gates in nano-scale CMOS technology. - Seyab Khan; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (DDECS, 2012)

Incorporating parameter variations in BTI impact on nano-scale logical gates analysis. - Seyab Khan; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (DFT, 2012)

Bias temperature instability analysis in SRAM decoder. - Seyab Khan; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (ETS, 2013)

BTI impact on SRAM sense amplifier. - Innocent Agbo; Seyab Khan; Said Hamdioui (IDT, 2013)

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. - Seyab Khan; Mottaqiallah Taouil; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (IDT, 2013)

Bias Temperature Instability analysis of FinFET based SRAM cells. - Seyab Khan; Innocent Agbo; Said Hamdioui; Halil Kukner; Ben Kaczer; Praveen Raghavan; Francky Catthoor (DATE, 2014)