Fast march tests for defects in resistive memory. - Seyed Nima Mozaffari; Spyros Tragoudas; Themistoklis Haniotakis (NANOARCH, 2015)

A new method to identify threshold logic functions. - Seyed Nima Mozaffari; Spyros Tragoudas; Themistoklis Haniotakis (DATE, 2017)

Reducing power, area, and delay of threshold logic gates considering non-integer weights. - Seyed Nima Mozaffari; Spyros Tragoudas; Themistoklis Haniotakis (ISCAS, 2017)

More Efficient Testing of Metal-Oxide Memristor-Based Memory. - Seyed Nima Mozaffari; Spyros Tragoudas; Themistoklis Haniotakis (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

An Aging Resilient Neural Network Architecture. - Seyed Nima Mozaffari; Krishna Prasad Gnawali; Spyros Tragoudas (NANOARCH, 2018)

A Generalized Approach to Implement Efficient CMOS-Based Threshold Logic Functions. - Seyed Nima Mozaffari; Spyros Tragoudas; Themistoklis Haniotakis (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test. - Seyed Nima Mozaffari; Bonita Bhaskaran; Kaushik Narayanun; Ayub Abdollahian; Vinod Pagalone; Shantanu Sarangi; Jonathon E. Colburn (ITC, 2019)

Low Power Artificial Neural Network Architecture. - Krishna Prasad Gnawali; Seyed Nima Mozaffari; Spyros Tragoudas (CoRR, 2019)

Observation Point Insertion Using Deep Learning. - Bonita Bhaskaran; Sanmitra Banerjee; Kaushik Narayanun; Shao-Chun Hung; Seyed Nima Mozaffari Mojaveri; Mengyun Liu; Gang Chen; Tung-Che Liang (ICCAD, 2022)

On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). - Seyed Nima Mozaffari; Bonita Bhaskaran; Shantanu Sarangi; Suhas M. Satheesh; Kuo Lin Fu; Nithin Valentine; P. Manikandan; Mahmut Yilmaz (VTS, 2022)