Fault Simulation for VHDL Based Test Bench and BIST Evaluation. - Hamed Farshbaf; Mina Zolfy; Shahrzad Mirkhani; Zainalabedin Navabi (Asian Test Symposium, 2001)

Adaptation of an event-driven simulation environment to sequentially propagated concurrent fault simulation. - Mina Zolfy; Shahrzad Mirkhani; Zainalabedin Navabi (DATE, 2001)

Hierarchical Fault Simulation Using Behavioral and Gate Level Hardware Models. - Shahrzad Mirkhani; Meisam Lavasani; Zainalabedin Navabi (Asian Test Symposium, 2002)

Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation. - Zainalabedin Navabi; Shahrzad Mirkhani; Meisam Lavasani; Fabrizio Lombardi (J. Electron. Test., 2004)

Enhancing Fault Simulation Performance by Dynamic Fault Clustering. - Shahrzad Mirkhani; Zainalabedin Navabi (Asian Test Symposium, 2005)

ESTA: An Efficient Method for Reliability Enhancement of RT-Level Designs. - Naghmeh Karimi; Shahrzad Mirkhani; Zainalabedin Navabi (ATS, 2006)

A Configurable Transaction Level Model of a Generic Interconnection Part of Embedded Systems Used in an ESL Design Library. - Parisa Razaghi; Shahrzad Mirkhani; Zainalabedin Navabi (FDL, 2007)

RT level reliability enhancement by constructing dynamic TMRS. - Naghmeh Karimi; Shahrzad Mirkhani; Zainalabedin Navabi; Fabrizio Lombardi (ACM Great Lakes Symposium on VLSI, 2007)

FALCON: Rapid statistical fault coverage estimation for complex designs. - Shahrzad Mirkhani; Jacob A. Abraham; Toai Vo; Hong Shin Jun; Bill Eklow (ITC, 2012)

Quantitative evaluation of soft error injection techniques for robust system design. - Hyungmin Cho; Shahrzad Mirkhani; Chen-Yong Cher; Jacob A. Abraham; Subhasish Mitra (DAC, 2013)

Rethinking error injection for effective resilience. - Shahrzad Mirkhani; Hyungmin Cho; Subhasish Mitra; Jacob A. Abraham (ASP-DAC, 2014)

EAGLE: A regression model for fault coverage estimation using a simulation based metric. - Shahrzad Mirkhani; Jacob A. Abraham (ITC, 2014)

Fast evaluation of test vector sets using a simulation-based statistical metric. - Shahrzad Mirkhani; Jacob A. Abraham (VTS, 2014)

Efficient soft error vulnerability estimation of complex designs. - Shahrzad Mirkhani; Subhasish Mitra; Chen-Yong Cher; Jacob A. Abraham (DATE, 2015)

In-depth soft error vulnerability analysis using synthetic benchmarks. - Shahrzad Mirkhani; Balavinayagam Samynathan; Jacob A. Abraham (VTS, 2015)

Clear: cross-layer exploration for architecting resilience combining hardware and software techniques to tolerate soft errors in processor cores. - Eric Cheng; Shahrzad Mirkhani; Lukasz G. Szafaryn; Chen-Yong Cher; Hyungmin Cho; Kevin Skadron; Mircea R. Stan; Klas Lilja; Jacob A. Abraham; Pradip Bose; Subhasish Mitra (DAC, 2016)

Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. - Eric Cheng; Jacob A. Abraham; Pradip Bose; Alper Buyuktosunoglu; Keith A. Campbell; Deming Chen; Chen-Yong Cher; Hyungmin Cho; Binh Q. Le; Klas Lilja; Shahrzad Mirkhani; Kevin Skadron; et al. (ICCD, 2017)

Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). - Eric Cheng; Shahrzad Mirkhani; Lukasz G. Szafaryn; Chen-Yong Cher; Hyungmin Cho; Kevin Skadron; Mircea R. Stan; Klas Lilja; Jacob A. Abraham; Pradip Bose; Subhasish Mitra (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Computational Storage For Big Data Analytics. - Balavinayagam Samynathan; Keith Chapman; Mehdi Nik; Behnam Robatmili; Shahrzad Mirkhani; Maysam Lavasani (ADMS@VLDB, 2019)

CLEAR Cross-Layer Resilience: A Retrospective. - Eric Cheng; Hyungmin Cho; Shahrzad Mirkhani; Lukasz G. Szafaryn; Jacob A. Abraham; Pradip Bose; Chen-Yong Cher; Klas Lilja; Kevin Skadron; Mircea Stan; Subhasish Mitra (IEEE Des. Test, 2025)