Structural approach for built-in tests in RF devices. - Deepa Mannath; Dallas Webster; Victor Montaño-Martinez; David Cohen; Shai Kush; Ganesan Thiagarajan; Adesh Sontakke (ITC, 2010)

Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs. - Deepa Mannath; David Cohen; Victor Montaño-Martinez; Rick Hudgens; Elida de-Obaldia; Shai Kush; Simon S. Ang (J. Electron. Test., 2011)