Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. - Ganesh Srinivasan; Shalabh Goyal; Abhijit Chatterjee (Asian Test Symposium, 2004)

Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester. - Shalabh Goyal; Michael Purtell (Asian Test Symposium, 2005)

Test time reduction of successive approximation register A/D converter by selective code measurement. - Shalabh Goyal; Abhijit Chatterjee; Mike Atia; Howard Iglehart; Chung Yu Chen; Bassem Shenouda; Nash Khouzam; Hosam Haggag (ITC, 2005)

Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of Sampling Clock Jitter. - Shalabh Goyal; Abhijit Chatterjee; Yanan Shieh (ATS, 2006)

Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. - Shalabh Goyal; Abhijit Chatterjee; Mike Atia (ETS, 2006)

Low Cost Parametric Failure Diagnosis of RF Transceivers. - Donghoon Han; Shalabh Goyal; Soumendu Bhattacharya; Abhijit Chatterjee (ETS, 2006)

A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. - Shalabh Goyal; Abhijit Chatterjee; Michael Purtell (J. Electron. Test., 2007)

Linearity Testing of A/D Converters Using Selective Code Measurement. - Shalabh Goyal; Abhijit Chatterjee (J. Electron. Test., 2008)

Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. - Sehun Kook; Hyun Woo Choi; Vishwanath Natarajan; Abhijit Chatterjee; Alfred V. Gomes; Shalabh Goyal; Le Jin (Asian Test Symposium, 2009)

Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. - Sehun Kook; Vishwanath Natarajan; Abhijit Chatterjee; Shalabh Goyal; Le Jin (ETS, 2009)