UV illumination effects on AlGaN/GaN HEMTs for tunable RF oscillators. - Shane Stein; Max Robbins; Pramod Reddy; Ramon Collazo; Spyridon Pavlidis (RWS, 2021)

Measurement of the $D_{it}$ Changes Under BTI-Stress in 4H-SiC FETs Using the Subthreshold Slope Method. - Philipp Steinmann; Daniel J. Lichtenwalner; Shane Stein; Jae-Hyung Park; Suman Das; Sei-Hyung Ryu (IRPS, 2024)