Voltage-Aware Chip-Level Design for Reliability-Driven Pin-Constrained EWOD Chips. - Sheng-Han Yeh; Jia-Wen Chang; Tsung-Wei Huang; Shang-Tsung Yu; Tsung-Yi Ho (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Reliability-Driven Chip-Level Design for High-Frequency Digital Microfluidic Biochips. - Shang-Tsung Yu; Sheng-Han Yeh; Tsung-Yi Ho (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)