Adaptive ECC Techniques for Yield and Reliability Enhancement of Flash Memories. - Shyue-Kung Lu; Shang-Xiu Zhong; Masaki Hashizume (ATS, 2016)

Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories. - Shyue-Kung Lu; Shang-Xiu Zhong; Masaki Hashizume (J. Electron. Test., 2018)