Test Time Minimisation in Scan Compression Designs Using Dynamic Channel Allocation. - Jais Abraham; Shankar Umapathi; Sumitha Krishnamurthi (VLSID, 2016)

Deep Learning-assisted Scan Chain Diagnosis with Different Fault Models during Manufacturing Test. - Utsav Jana; Sourav Banerjee; Binod Kumar 001; Madhu B; Shankar Umapathi; Masahiro Fujita (ATS, 2022)