Modeling Yield of Carbon-Nanotube/Silicon-Nanowire FET-Based Nanoarray Architecture with h-hot Addressing Scheme. - Shanrui Zhang; Minsu Choi; Nohpill Park (DFT, 2004)

Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment. - Shanrui Zhang; Minsu Choi; Nohpill Park; Fabrizio Lombardi (DFT, 2004)

Cost-Driven Optimization of Coverage of Combined Built-In Self-Test/Automated Test Equipment Testing. - Shanrui Zhang; Minsu Choi; Nohpill Park; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2007)