Global and Local Contrastive Learning for Classification and Segmentation of Mixed-type Wafer Bin Map Defect Patterns. - Shantong Yin; Rui Wang; Peng Li (IEEM, 2024)

Spatial and channel level feature redundancy reduction for differentiable neural architecture search. - Shantong Yin; Ben Niu; Rui Wang; Xin Wang (Neurocomputing, 2025)