NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations. - Sharifah Wan Muhamad Hatta; Norhayati Soin; D. Abd Hadi; Jianfu Zhang 001 (Microelectron. Reliab., 2010)

Energy distribution of positive charges in high-k dielectric. - Sharifah Wan Muhamad Hatta; Zhigang Ji; Jianfu Zhang 001; Weidong Zhang 002; Norhayati Soin; Ben Kaczer; Stefan De Gendt; Guido Groeseneken (Microelectron. Reliab., 2014)

Defects evolution involving interface dispersion approaches in high-k/metal-gate deep-submicron CMOS. - Yasmin Abdul Wahab; Norhayati Soin; Sharifah Wan Muhamad Hatta (Microelectron. Reliab., 2014)

Comprehensive Study on RF-MEMS Switches Used for 5G Scenario. - Li-Ya Ma; Norhayati Soin; Mohamad Hazwan Mohd Daut; Sharifah Wan Muhamad Hatta (IEEE Access, 2019)

Delay performance due to thermal variation on field-programmable gate array via the adoption of a stable ring oscillator. - Anuar Jaafar; Norhayati Soin; Sharifah Wan Muhamad Hatta; Sani Irwan Md. Salim (IET Comput. Digit. Tech., 2019)

Evaluation and Perspective of Analog Low-Dropout Voltage Regulators: A Review. - Tan Yee Chyan; Harikrishnan Ramiah; Sharifah Wan Muhamad Hatta; Nai Shyan Lai; Chee-Cheow Lim; Yong Chen 005; Pui-In Mak; Rui Paulo Martins (IEEE Access, 2022)

A Capacitorless Flipped-Voltage-Follower-Based Low-Dropout Regulator Incorporating Adaptive-Compensation Buffer. - Tan Yee Chyan; Harikrishnan Ramiah; Sharifah Wan Muhamad Hatta; Chee-Cheow Lim; Rui Paulo Martins; Pui-In Mak; Yong Chen 005 (IEEE Trans. Very Large Scale Integr. Syst., 2025)