Experimental investigation on the evolution of a conducted-EMI buck converter after thermal aging tests of the MOSFET. - Shawki Douzi; Mohamed Tlig; Jaleleddine Ben Hadj Slama (Microelectron. Reliab., 2015)

Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests. - Shawki Douzi; Moncef Kadi; Habib Boulzazen; Mohamed Tlig; Jaleleddine Ben Hadj Slama (Microelectron. Reliab., 2018)