A Modification of Lee's Path Connection Algorithm. - Sheldon B. Akers (IEEE Trans. Electron. Comput., 1967)

A parity bit signature for exhaustive testing. - Sheldon B. Akers (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Test Set Embedding in a Built-In Self-Test Environment. - Sheldon B. Akers; Winston Jansz (ITC, 1989)

A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination. - Sungju Park; Sheldon B. Akers (ITC, 1992)

Parity bit calculation and test signal compaction for BIST applications. - Sungju Park; Sheldon B. Akers (J. Electron. Test., 1992)