GaAs Driver and Sensor for a High-Speed Test System. - Sheng-Jen Tsai; Charles D. Hechtman (ITC, 1988)

A high-speed pin-memory architecture using multiport dynamic RAMs. - Sheng-Jen Tsai; Wha-Joon Lee (ITC, 1990)

Test Vector Generation for Linear Analog Devices. - Sheng-Jen Tsai (ITC, 1991)