Repairable Cell-Based Chip Design for Simultaneous Yield Enhancement and Fault Diagnosis. - Sheng-Lin Lin; Cheng-Hung Wu; Kuen-Jong Lee (ATS, 2016)

A Repair-for-Diagnosis Methodology for Logic Circuits. - Cheng-Hung Wu; Sheng-Lin Lin; Kuen-Jong Lee; Sudhakar M. Reddy (IEEE Trans. Very Large Scale Integr. Syst., 2018)