Use of variable range in solving multiple criteria scheduling problems. - Ching-Jong Liao; Rong-Hwa Huang; Sheng-Tsaing Tseng (Comput. Oper. Res., 1992)

Optimal production run length for products sold with warranty. - Ruey-Huei Yeh; Wen-Tsung Ho; Sheng-Tsaing Tseng (Eur. J. Oper. Res., 2000)

Optimal design for step-stress accelerated degradation tests. - Chen-Mao Liao; Sheng-Tsaing Tseng (IEEE Trans. Reliab., 2006)

Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller. - Sheng-Tsaing Tseng; Jen Tang; Chien-Hua Lin (Technometrics, 2007)

A Technical Note on "Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller". - Sheng-Tsaing Tseng; Bo-Yan Jou (Technometrics, 2009)

Mis-Specification Analysis of Linear Degradation Models. - Chien-Yu Peng; Sheng-Tsaing Tseng (IEEE Trans. Reliab., 2009)

Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. - Sheng-Tsaing Tseng; Narayanaswamy Balakrishnan 001; Chih-Chun Tsai (IEEE Trans. Reliab., 2009)

Fault Detection based on Statistical Multivariate Analysis and Microarray-type Visualization. - Ming-Da Ma; David Shan-Hill Wong; Shi-Shang Jang; Sheng-Tsaing Tseng (IEEE Trans. Ind. Informatics, 2010)

Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products. - Chien-Yu Peng; Sheng-Tsaing Tseng (IEEE Trans. Reliab., 2010)

Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process. - Chih-Chun Tsai; Sheng-Tsaing Tseng; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2011)

Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects. - Chih-Chun Tsai; Sheng-Tsaing Tseng; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2012)

Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models. - Chien-Yu Peng; Sheng-Tsaing Tseng (IEEE Trans. Reliab., 2013)

Adaptive Warranty Prediction for Highly Reliable Products. - Nan-Jung Hsu; Sheng-Tsaing Tseng; Ming-Wei Chen (IEEE Trans. Reliab., 2015)

Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models. - Sheng-Tsaing Tseng; I-Chen Lee (Technometrics, 2016)

A Multivariate EWMA Controller for Linear Dynamic Processes. - Sheng-Tsaing Tseng; Hsin-Chao Mi; I-Chen Lee (Technometrics, 2016)

A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models. - Sheng-Tsaing Tseng; Pei-Yu Chen (Technometrics, 2017)

Sequential Bayesian Design for Accelerated Life Tests. - I-Chen Lee; Yili Hong 001; Sheng-Tsaing Tseng; Tirthankar Dasgupta (Technometrics, 2018)

Stability conditions and robustness analysis of a general MMSE run-to-run controller. - Sheng-Tsaing Tseng; Fugee Tsung; Jo-Hua Wu (IISE Trans., 2019)

Model Misspecification of Generalized Gamma Distribution for Accelerated Lifetime-Censored Data. - Marzieh Khakifirooz; Sheng-Tsaing Tseng; Mahdi Fathi 001 (Technometrics, 2020)

Neural ordinary differential equation for sequential optimal design of fatigue test under accelerated life test analysis. - Marzieh Khakifirooz; Mahdi Fathi 001; I-Chen Lee; Sheng-Tsaing Tseng (Reliab. Eng. Syst. Saf., 2023)