Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology. - Ming-Hung Weng; Chao-Hung Chen; Che-Kai Lin; Shih-Hui Huang; Jhih-Han Du; Sheng-Wen Peng; Walter Wohlmuth; Frank Yung-Shi Chou; Chang-Hwang Hua (Microelectron. Reliab., 2014)

Performance Improvement and Layout Design Comparison of AlGaN/GaN HEMT for Ka- Q- and V-band Applications. - Keiichi Matsushita; Chih-Yuan Chan; Ju-Hsien Lin; Sheng-Wen Peng; Hung-Kuan Lo; Yu-Syuan Lin; Cheng-Kuo Lin (BCICTS, 2022)