High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure. - Zhihua Dong; Jinyan Wang; Cheng P. Wen; Shenghou Liu; Rumin Gong; Min Yu; Yilong Hao; Fujun Xu; Bo Shen; Yangyuan Wang (Microelectron. Reliab., 2012)