Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory. - Victor Chao-Wei Kuo; Chih-Ming Chao; Chih-Kai Kang; Li-Wei Liu; Tzung-Bin Huang; Liang-Tai Kuo; Shi-Hsien Chen; Houng-Chi Wei; Hann-Ping Hwang; Saysamone Pittikoun (MTDT, 2006)