Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. - Damien Leroy; Rémi Gaillard; Erwin Schäfer; Cyrille Beltrando; Shi-Jie Wen; Richard Wong (IOLTS, 2008)

A Systematical Method of Quantifying SEU FIT. - Shi-Jie Wen; Dan Alexandrescu; Renaud Perez (IOLTS, 2008)

Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. - Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (IEEE Trans. Circuits Syst. I Regul. Pap., 2010)

Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. - David Rennie; David Li 002; Manoj Sachdev; Bharat L. Bhuva; Srikanth Jagannathan; Shi-Jie Wen; Rick Wong (CICC, 2011)

Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. - Massoud Mokhtarpour Ghahroodi; Mark Zwolinski; Rick Wong; Shi-Jie Wen (ETS, 2011)

Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms. - Naifeng Jing; Ju-Yueh Lee; Zhe Feng 002; Weifeng He; Zhigang Mao; Shi-Jie Wen; Rick Wong; Lei He 001 (FPL, 2011)

Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. - Changmin Jung; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (ISQED, 2011)

Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS. - Jian Liu 027; Xin Wang 031; Hui Zhao 014; Qiang Fang; Albert Z. Wang; Lin Lin 011; He Tang; Siqiang Fan; Bin Zhao 002; Shi-Jie Wen; Richard Wong (IEEE J. Solid State Circuits, 2011)

Mitigating the effects of large multiple cell upsets (MCUs) in memories. - Juan Antonio Maestro; Pedro Reviriego; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (ACM Trans. Design Autom. Electr. Syst., 2011)

Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs. - Ju-Yueh Lee; Cheng-Ru Chang; Naifeng Jing; Juexiao Su; Shi-Jie Wen; Rick Wong; Lei He 001 (FPT, 2012)

RIIF - Reliability information interchange format. - Adrian Evans; Michael Nicolaidis; Shi-Jie Wen; Dan Alexandrescu; Enrico Costenaro (IOLTS, 2012)

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. - Yi Ren; L. Fan; Li Chen 001; Shi-Jie Wen; Richard Wong; N. W. van Vonno; Arthur F. Witulski; Bharat L. Bhuva (J. Electron. Test., 2012)

Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. - David Rennie; David Li 002; Manoj Sachdev; Bharat L. Bhuva; Srikanth Jagannathan; Shi-Jie Wen; Richard Wong (IEEE Trans. Circuits Syst. I Regul. Pap., 2012)

Networking industry trends in ESD protection for high speed IOs. - Richard Wong; Rita Fung; Shi-Jie Wen (ASICON, 2013)

Error detection in ternary CAMs using bloom filters. - Salvatore Pontarelli; Marco Ottavi; Adrian Evans; Shi-Jie Wen (DATE, 2013)

Placement of repair circuits for in-field FPGA repair. - Michael J. Wirthlin; Joshua E. Jensen; Alex Wilson; William Howes; Shi-Jie Wen; Rick Wong (FPGA, 2013)

Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. - Adrian Evans; Michael Nicolaidis; Shi-Jie Wen; Thiago Asis (ISQED, 2013)

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. - Hao Xie; Li Chen 001; Adrian Evans; Shi-Jie Wen; Rick Wong (PRDC, 2013)

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. - Yi Ren; Shuting Shi; Li Chen 001; Haibin Wang; L.-J. Gao; Gang Guo; Shi-Jie Wen; Richard Wong; N. W. van Vonno (J. Electron. Test., 2013)

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. - Zhichao Zhang; Yi Ren; Li Chen 001; Nelson J. Gaspard; Arthur F. Witulski; W. Timothy Holman; Bharat L. Bhuva; Shi-Jie Wen; Ramaswami Sammynaiken (J. Electron. Test., 2013)

Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. - Juan Antonio Maestro; Pedro Reviriego; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (Microprocess. Microsystems, 2013)

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. - Hao Xie; Li Chen 001; Rui Liu 011; Adrian Evans; Dan Alexandrescu; Shi-Jie Wen; Rick Wong (IOLTS, 2014)

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. - Yi Ren; Anlin He; Shuting Shi; Gang Guo; Li Chen 001; Shi-Jie Wen; Richard Wong; N. W. van Vonno; Bharat L. Bhuva (J. Electron. Test., 2014)

Single Event Resilient Dynamic Logic Designs. - Haibin Wang; Mulong Li; Li Chen 001; Rui Liu 011; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong; Rita Fung; Jinshun Bi (J. Electron. Test., 2014)

Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. - Jiajia Jiao; Yuzhuo Fu; Shi-Jie Wen (Microelectron. Reliab., 2014)

Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. - GeunYong Bak; Soonyoung Lee; Hosung Lee; Kyungbae Park; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong; Charlie Slayman (IRPS, 2015)

Analysis of advanced circuits for SET measurement. - Rui Liu 011; Adrian Evans; Qiong Wu; Yuanqing Li; Li Chen 001; Shi-Jie Wen; Rick Wong; Rita Fung (IRPS, 2015)

Terrestrial SER characterization for nanoscale technologies: A comparative study. - Nihaar N. Mahatme; Bharat L. Bhuva; Nelson J. Gaspard; T. Assis; Y. Xu; P. Marcoux; M. Vilchis; Balaji Narasimham; A. Shih; Shi-Jie Wen; Rick Wong; N. Tam; et al. (IRPS, 2015)

New insights into the impact of SEUs in FPGA CRAMs. - Sheng Wang; Adrian Evans; Shi-Jie Wen; Rick Wong; GengSheng Chen (IEICE Electron. Express, 2015)

Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. - Saqib A. Khan; Shi-Jie Wen; Sanghyeon Baeg (IEICE Electron. Express, 2016)

Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. - Saqib A. Khan; Shi-Jie Wen; Sanghyeon Baeg (IEICE Electron. Express, 2016)

IZIP: In-place zero overhead interconnect protection via PIP redundancy. - Yi Luo; Adrian Evans; Shi-Jie Wen; Rick Wong; GengSheng Chen (ASICON, 2017)

BPPT - Bulk potential protection technique for hardened sequentials. - Issam Nofal; Adrian Evans; Anlin He; Gang Guo; Yuanqing Li; Li Chen 001; Rui Liu 011; Haibin Wang; Mo Chen 008; Sang H. Baeg; Shi-Jie Wen; Richard Wong (IOLTS, 2017)

Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device. - Hosung Lee; Sanghyeon Baeg; Nelson Hua; Shi-Jie Wen (Microelectron. Reliab., 2017)

Single-event effects on optical transceiver. - Kurt J. Lezon; Shi-Jie Wen; Y.-F. Dan; Richard Wong; Bharat L. Bhuva (IRPS, 2018)

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning. - Somnath Kundu; Muqing Liu; Richard Wong; Shi-Jie Wen; Chris H. Kim (ISSCC, 2018)

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. - Yuanqing Li; Li Chen 001; Issam Nofal; Mo Chen 008; Haibin Wang; Rui Liu 011; Qingyu Chen; Milos Krstic; Shuting Shi; Gang Guo; Sang H. Baeg; Shi-Jie Wen; et al. (Microelectron. Reliab., 2018)

Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. - Chul Seung Lim; Kyungbae Park; GeunYong Bak; Donghyuk Yun; Myungsang Park; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (Microelectron. Reliab., 2018)

Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. - Jingchen Cao; Lyuan Xu; Bharat L. Bhuva; Shi-Jie Wen; Richard Wong; Balaji Narasimham; Lloyd W. Massengill (IRPS, 2019)

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. - Lyuan Xu; Jingchen Cao; Bharat L. Bhuva; Indranil Chatterjee; Shi-Jie Wen; Richard Wong; Lloyd W. Massengill (IRPS, 2019)

A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer. - Somnath Kundu; Muqing Liu; Shi-Jie Wen; Richard Wong; Chris H. Kim (IEEE J. Solid State Circuits, 2019)

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. - Jingchen Cao; Lyuan Xu; Shi-Jie Wen; Rita Fung; Balaji Narasimham; Lloyd W. Massengill; Bharat L. Bhuva (IRPS, 2020)

Use of Silicon-based Sensors for System Reliability Prediction. - Dmitry Goloubev; Shi-Jie Wen; Donald Allen; Ranjani Ram; Firdous Bano; Nithin Guruswamy; James Turman (IRPS, 2020)

Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System. - Andrew M. Keller; Jared Anderson; Michael J. Wirthlin; Shi-Jie Wen; Rita Fung; Conner Chambers (IRPS, 2020)

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. - Lyuan Xu; Jingchen Cao; John Brockman; Carlo Cazzaniga; Christopher Frost 002; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2020)

High-Current State triggered by Operating-Frequency Change. - Lyuan Xu; Jingchen Cao; Shi-Jie Wen; Rita Fung; Jamie Markevitch; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2020)

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. - Yoni Xiong; Alexandra Feeley; Lloyd W. Massengill; Bharat L. Bhuva; Shi-Jie Wen; Rita Fung (IRPS, 2021)

Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation. - Donghyuk Yun; Myungsang Park; GeunYong Bak; Sanghyeon Baeg; Shi-Jie Wen (IEEE Access, 2021)

Spatio-temporal AI inference engine for estimating hard disk reliability. - Sanchita Basak; Saptarshi Sengupta; Shi-Jie Wen; Abhishek Dubey (Pervasive Mob. Comput., 2021)

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. - Yoni Xiong; Alexandra Feeley; Nicholas J. Pieper; Dennis R. Ball; Balaji Narasimham; John Brockman; N. A. Dodds; S. A. Wender; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2022)

Traffic Anomaly Detection Via Conditional Normalizing Flow. - Zhuangwei Kang; Ayan Mukhopadhyay; Aniruddha Gokhale; Shi-Jie Wen; Abhishek Dubey (ITSC, 2022)

Generative Anomaly Detection for Time Series Datasets. - Zhuangwei Kang; Ayan Mukhopadhyay; Aniruddha Gokhale; Shi-Jie Wen; Abhishek Dubey (CoRR, 2022)

Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components. - Hyeongseok Oh; Myungsun Chun; Jiwon Lee; Shi-Jie Wen; Nick Yu; Byung-Gun Park; Sanghyeon Baeg (IRPS, 2023)

Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. - Nicholas J. Pieper; M. Chun; Yoni Xiong; H. M. Dattilo; Jenna B. Kronenberg; Sanghyeon Baeg; Shi-Jie Wen; Rita Fung; D. Chan; C. Escobar; Bharat L. Bhuva (IRPS, 2024)