Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions. - Takayuki Hisaka; Hajime Sasaki; Yoichi Nogami; Kenji Hosogi; Naohito Yoshida; Anita A. Villanueva; Jesús A. del Alamo; Shigehiko Hasegawa; Hajime Asahi (Microelectron. Reliab., 2009)