Test generation systems in Japan. - Shigehiro Funatsu; Nobuo Wakatsuki; Toshihiro Arima (DAC, 1975)

Automatic test generation for large digital circuits. - Akihiko Yamada; Nobuo Wakatsuki; Hideo Shibano; Osamu Itoh; Kyoji Tomita; Shigehiro Funatsu (DAC, 1977)

Automatic System Level Test Generation and Fault Location for Large Digital Systems. - Akihiko Yamada; Nobuo Wakatsuki; T. Fukui; Shigehiro Funatsu (DAC, 1978)

A Calculus of Testability Measure at the Functional Level. - Shigeru Takasaki; Masato Kawai; Shigehiro Funatsu; Akihiko Yamada (ITC, 1981)

A High Level Test Pattern Generation Algorithm. - Masato Kawai; Hideo Shibano; Shigehiro Funatsu; Shunichi Kato; T. Kurobe; K. Ookawa; Tohru Sasaki (ITC, 1983)

An AC/DC Test Generation System for Gate Array LSIs. - T. Shimono; K. Oozeki; M. Takahashi; Masato Kawai; Shigehiro Funatsu (ITC, 1985)

An Automatic Test-Generation System for Large Digital Circuits. - Shigehiro Funatsu; Masato Kawai (IEEE Des. Test, 1985)

Test Data Quality Assurance. - Masato Kawai; T. Shimono; Shigehiro Funatsu (ITC, 1986)

Scan design at NEC. - Shigehiro Funatsu; Masato Kawai; Akihiko Yamada (IEEE Des. Test, 1989)