A high-speed IDDQ sensor implementation. - Yann Antonioli; Tsuneo Inufushi; Shigeki Nishikawa; Kozo Kinoshita (Asian Test Symposium, 2000)

Reducing Scan Shifts Using Folding Scan Trees. - Hiroyuki Yotsuyanagi; Toshimasa Kuchii; Shigeki Nishikawa; Masaki Hashizume; Kozo Kinoshita (Asian Test Symposium, 2003)

Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. - Hideyuki Ichihara; Kozo Kinoshita; Koji Isodono; Shigeki Nishikawa (VLSI Design, 2003)

On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. - Hiroyuki Yotsuyanagi; Toshimasa Kuchii; Shigeki Nishikawa; Masaki Hashizume; Kozo Kinoshita (DELTA, 2004)

Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. - Hiroyuki Yotsuyanagi; Toshimasa Kuchii; Shigeki Nishikawa; Masaki Hashizume; Kozo Kinoshita (J. Electron. Test., 2005)