A 55-ns 16-Mb DRAM with built-in self-test function using microprogram ROM. - Toshio Takeshima; Masahide Takada; Hiroki Koike; Hiroshi Watanabe; Shigeru Koshimaru; Kenjiro Mitake; Wataru Kikuchi; Takaho Tanigawa; Tatsunori Murotani; Kenji Noda; Kazuhiro Tasaka; Koji Yamanaka; et al. (IEEE J. Solid State Circuits, 1990)