Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. - Shigeru Nakahara; Keiichi Higeta; Masaki Kohno; Toshiaki Kawamura; Keizo Kakitani (ITC, 1999)

A design for a minimum Hamming-distance search using asynchronous digital techniques. - Shigeru Nakahara; Takahiro Kawata (IEEE J. Solid State Circuits, 2005)