MMIC family for DBS down-converter with pulse-doped GaAs MESFETs. - Nobuo Shiga; Takeshi Sekiguchi; Shigeru Nakajima; Kenji Otobe; Nobuhiro Kuwata; Ken-ichiro Matsuzaki; Hideki Hayashi (IEEE J. Solid State Circuits, 1992)

A high-speed 2-D topography simulator based on a pixel model. - Satoshi Tazawa; Katsuyuki Ochiai; Seitaro Matsuo; Shigeru Nakajima (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997)

Editorial. - Daniel L. Barton; Shigeru Nakajima; Massimo Vanzi (Microelectron. Reliab., 2001)

Electromigration and electrochemical reaction mixed failure mechanism in gold interconnection system. - Hide Murayama; Makoto Yamazaki; Shigeru Nakajima (Microelectron. Reliab., 2001)

Effect of CVD-SiO2 film on reliability of GaAs MESFET with Ti/Pt/Au gate metal. - Yoshihiro Saito; Tatsuya Hashinaga; Shigeru Nakajima (IEEE Trans. Reliab., 2005)

Noninvasive Localization of IGBT Faults by High-Sensitivity Magnetic Probe With RF Stimulation. - Nguyen Ngoc Mai Khanh; Shigeru Nakajima; Tetsuya Iizuka; Yoshio Mita; Kunihiro Asada (IEEE Trans. Instrum. Meas., 2018)