Analysis and Definition of Overall Timing Accuracy in VLSI Test System. - Shigeru Sugamori; Kenji Yoshida; Hiromi Maruyama; Shinpei Kamata; Tsuneta Sudo (ITC, 1981)

High-Fidelity Device Tester Interface. - Shigeru Sugamori; Kunio Takeuchi; Hiromi Maruyama; Shinpei Kamata (ITC, 1983)