Test Generation of Path Delay Faults Induced by Defects in Power TSV. - Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; Krishnendu Chakrabarty (Asian Test Symposium, 2013)

DR-Scan: Dual-Rail Asynchronous Scan DfT and ATPG. - Shih-An Hsieh; Ying-Hsu Wang; Ting-Yu Shen; Kuan-Yen Huang; Chia-Cheng Pai; Tsai-Chieh Chen; James Chien-Mo Li (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)