A framework for nonparametric profile monitoring. - Shih-Chung Chuang; Ying-Chao Hung; Wen-Chi Tsai; Su-Fen Yang (Comput. Ind. Eng., 2013)

Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement. - Chen-Fu Chien 001; Chiao-Wen Liu; Shih-Chung Chuang (Int. J. Prod. Res., 2017)