Testing retention flip-flops in power-gated designs. - Hao-Wen Hsu; Shih-Hua Kuo; Wen-Hsiang Chang; Shi-Hao Chen; Ming-Tung Chang; Mango Chia-Tso Chao (VTS, 2013)

Statistical techniques for predicting system-level failure using stress-test data. - Harry H. Chen; Shih-Hua Kuo; Jonathan Tung; Mango Chia-Tso Chao (VTS, 2015)

Random pattern generation for post-silicon validation of DDR3 SDRAM. - Hao-Yu Yang; Shih-Hua Kuo; Tzu-Hsuan Huang; Chi-Hung Chen; Chris Lin; Mango Chia-Tso Chao (VTS, 2015)