Improvement of power distribution network using correlation-based regression analysis. - Shiho Hagiwara; Takumi Uezono; Takashi Sato 001; Kazuya Masu (ACM Great Lakes Symposium on VLSI, 2007)

A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. - Takashi Sato 001; Takumi Uezono; Shiho Hagiwara; Kenichi Okada 001; Shuhei Amakawa; Noriaki Nakayama; Kazuya Masu (ISQED, 2007)

Weakness Identification for Effective Repair of Power Distribution Network. - Takashi Sato 001; Shiho Hagiwara; Takumi Uezono; Kazuya Masu (PATMOS, 2007)

Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network. - Shiho Hagiwara; Takumi Uezono; Takashi Sato 001; Kazuya Masu (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2008)

Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits. - Shiho Hagiwara; Takashi Sato 001; Kazuya Masu (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009)

Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis. - Kentaro Katayama; Shiho Hagiwara; Hiroshi Tsutsui; Hiroyuki Ochi; Takashi Sato 001 (ICCAD, 2010)

Robust importance sampling for efficient SRAM yield analysis. - Takanori Date; Shiho Hagiwara; Kazuya Masu; Takashi Sato 001 (ISQED, 2010)

Linear time calculation of state-dependent power distribution network capacitance. - Shiho Hagiwara; Koh Yamanaga; Ryo Takahashi; Kazuya Masu; Takashi Sato 001 (ISQED, 2010)

Linear Time Calculation of On-Chip Power Distribution Network Capacitance Considering State-Dependence. - Shiho Hagiwara; Koh Yamanaga; Ryo Takahashi; Kazuya Masu; Takashi Sato 001 (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010)

Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis. - Shiho Hagiwara; Takanori Date; Kazuya Masu; Takashi Sato 001 (IEICE Trans. Electron., 2014)

State-Dependence of On-Chip Power Distribution Network Capacitance. - Koh Yamanaga; Shiho Hagiwara; Ryo Takahashi; Kazuya Masu; Takashi Sato 001 (IEICE Trans. Electron., 2014)

Thermal Scaffolding for Ultra-Dense 3D Integrated Circuits. - Dennis Rich; Anna Kasperovich; Mohamadali Malakoutian; Robert M. Radway; Shiho Hagiwara; Takahide Yoshikawa; Srabanti Chowdhury; Subhasish Mitra (DAC, 2023)