Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test. - Stefan Holst; Shiling Shi; Xiaoqing Wen (PRDC, 2019)

Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling. - Shiling Shi; Stefan Holst; Xiaoqing Wen (MCSoC, 2023)

GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting. - Shiling Shi; Stefan Holst; Xiaoqing Wen (IEICE Trans. Inf. Syst., 2023)