Model-based Kernel Testing for Concurrency Bugs through Counter Example Replay. - Moonzoo Kim; Shin Hong; Changki Hong; Taeho Kim (MBT@ETAPS, 2009)

Testing concurrent programs to achieve high synchronization coverage. - Shin Hong; Jaemin Ahn; Sangmin Park; Moonzoo Kim; Mary Jean Harrold (ISSTA, 2012)

Understanding user understanding: determining correctness of generated program invariants. - Matt Staats; Shin Hong; Moonzoo Kim; Gregg Rothermel (ISSTA, 2012)

The Impact of Concurrent Coverage Metrics on Testing Effectiveness. - Shin Hong; Matt Staats; Jaemin Ahn; Moonzoo Kim; Gregg Rothermel (ICST, 2013)

Effective pattern-driven concurrency bug detection for operating systems. - Shin Hong; Moonzoo Kim (J. Syst. Softw., 2013)

Detecting Concurrency Errors in Client-Side Java Script Web Applications. - Shin Hong; Yongbae Park; Moonzoo Kim (ICST, 2014)

Systematic Testing of Reactive Software with Non-Deterministic Events: A Case Study on LG Electric Oven. - Yongbae Park; Shin Hong; Moonzoo Kim; Dongju Lee; Junhee Cho (ICSE (2), 2015)

Mutation-Based Fault Localization for Real-World Multilingual Programs (T). - Shin Hong; Byeongcheol Lee; Taehoon Kwak; Yiru Jeon; Bongsuk Ko; Yunho Kim; Moonzoo Kim (ASE, 2015)

A survey of race bug detection techniques for multithreaded programmes. - Shin Hong; Moonzoo Kim (Softw. Test. Verification Reliab., 2015)

Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. - Shin Hong; Matt Staats; Jaemin Ahn; Moonzoo Kim; Gregg Rothermel (Softw. Test. Verification Reliab., 2015)

MUSEUM: Debugging real-world multilingual programs using mutation analysis. - Shin Hong; Taehoon Kwak; Byeongcheol Lee; Yiru Jeon; Bongseok Ko; Yunho Kim; Moonzoo Kim (Inf. Softw. Technol., 2017)

Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage. - Yunho Kim; Shin Hong; Bongseok Ko; Duy Loc Phan; Moonzoo Kim (ICST, 2018)

Classifying False Positive Static Checker Alarms in Continuous Integration Using Convolutional Neural Networks. - Seongmin Lee 001; Shin Hong; Jungbae Yi; Taeksu Kim; Chul-Joo Kim; Shin Yoo (ICST, 2019)

Target-driven compositional concolic testing with function summary refinement for effective bug detection. - Yunho Kim; Shin Hong; Moonzoo Kim (ESEC/SIGSOFT FSE, 2019)

Threats to validity in experimenting mutation-based fault localization. - Juyoung Jeon; Shin Hong (ICSE (NIER), 2020)

Using SMT Solver and Logic Puzzles for Teaching Computational Logics in Discrete Mathematics Class. - Shin Hong (SIGCSE, 2020)

Improving Mutation-Based Fault Localization with Plausible-code Generating Mutation Operators. - Juyoung Jeon; Shin Hong (ASE, 2021)

Improving Configurability of Unit-level Continuous Fuzzing: An Industrial Case Study with SAP HANA. - Hanyoung Yoo; Jingun Hong; Lucas Bader; Dongwon Hwang; Shin Hong (ASE, 2021)

Empirical Study of Effectiveness of EvoSuite on the SBST 2020 Tool Competition Benchmark. - Robert Sebastian Herlim; Shin Hong; Yunho Kim; Moonzoo Kim (SSBSE, 2021)

DEMINER: test generation for high test coverage through mutant exploration. - Yunho Kim; Shin Hong (Softw. Test. Verification Reliab., 2021)

Inferring Fine-grained Traceability Links between Javadoc Comment and JUnit Test Code. - Jeewoong Kim; Shin Hong (ICSME, 2022)

Repairing Fragile GUI Test Cases Using Word and Layout Embedding. - Juyeon Yoon; Seungjoon Chung; Kihyuck Shin; Jinhan Kim; Shin Hong; Shin Yoo (ICST, 2022)

Learning-based mutant reduction using fine-grained mutation operators. - Yunho Kim; Shin Hong (Softw. Test. Verification Reliab., 2022)

Predictive Mutation Analysis via the Natural Language Channel in Source Code. - Jinhan Kim; Juyoung Jeon; Shin Hong; Shin Yoo (ACM Trans. Softw. Eng. Methodol., 2022)

Poster: BugOss: A Regression Bug Benchmark for Empirical Study of Regression Fuzzing Techniques. - Jeewoong Kim; Shin Hong (ICST, 2023)

Introduction to the special issue on automation of software test and test code quality. - Antonia Bertolino; Shin Hong; Aditya P. Mathur (J. Softw. Evol. Process., 2023)

BugOss: A benchmark of real-world regression bugs for empirical investigation of regression fuzzing techniques. - Jeewoong Kim; Shin Hong (J. Syst. Softw., 2024)

Refining Fuzzed Crashing Inputs for Better Fault Diagnosis. - Kieun Kim; Seongmin Lee 001; Shin Hong (SIGSOFT FSE Companion, 2025)

ZigZagFuzz: Interleaved Fuzzing of Program Options and Files. - Ahcheong Lee; Youngseok Choi; Shin Hong; Yunho Kim; Kyutae Cho; Moonzoo Kim (ACM Trans. Softw. Eng. Methodol., 2025)