Characteristics of Nano-Grating N-Channel MOSFETs for Improved Current Drivability. - Xiaoli Zhu; Shin-Ichiro Kuroki; Koji Kotani; Hideharu Shido; Masatoshi Fukuda; Yasuyoshi Mishima; Takashi Ito (IEICE Trans. Electron., 2007)

Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels. - Takashi Ito; Xiaoli Zhu; Shin-Ichiro Kuroki; Koji Kotani (IEICE Trans. Electron., 2010)

ARIM-mdx Data System: Towards a Nationwide Data Platform for Materials Science. - Masatoshi Hanai; Ryo Ishikawa; Mitsuaki Kawamura; Masato Ohnishi; Norio Takenaka; Kou Nakamura; Daiju Matsumura; Seiji Fujikawa; Hiroki Sakamoto; Yukinori Ochiai; Tetsuo Okane; Shin-Ichiro Kuroki; et al. (IEEE Big Data, 2024)

ARIM-mdx Data System: Towards a Nationwide Data Platform for Materials Science. - Masatoshi Hanai; Ryo Ishikawa; Mitsuaki Kawamura; Masato Ohnishi; Norio Takenaka; Kou Nakamura; Daiju Matsumura; Seiji Fujikawa; Hiroki Sakamoto; Yukinori Ochiai; Tetsuo Okane; Shin-Ichiro Kuroki; et al. (CoRR, 2024)