Advanded Design Verification and Debugging Techniques Based on Optical Fault Isolation Method. - Ghil-Geun Oh; Jong-Ho Eun; Shin-Young Chung; Brandon Lee (ISOCC, 2019)

Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology. - Seongkyung Kim; Ukjin Jung; Seungjin Choo; Kihyun Choi; Tae-Jin Chung; Shin-Young Chung; Euncheol Lee; Juhun Park; Deokhan Bae; Myungyoon Um (IRPS, 2022)

Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology. - Taiki Uemura; Byungjin Chung; Jegon Kim; Hyewon Shim; Shin-Young Chung; Brandon Lee; Jaehee Choi; Shota Ohnishi; Ken Machida (IRPS, 2022)

Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices. - Taiki Uemura; Byungjin Chung; Jegon Kim; Hyewon Shim; Shin-Young Chung; Brandon Lee; Jaehee Choi; Shota Ohnishi; Ken Machida (IRPS, 2022)

Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs. - Seongkyung Kim; Hyerim Park; Eunyu Choi; Young Han Kim; Dahyub Kim; Hyewon Shim; Shin-Young Chung; Paul Jung (IRPS, 2023)

Impact of Barrier Metal Thickness on SRAM Reliability. - Rakesh Ranjan; Pavitra Ramadevi Perepa; Ki-Don Lee; Hokyung Park; Peter Kim; Ganesh Chakravarthy Yerubandi; Jon Haefner; Caleb Dongkyun Kwon; Minjung Jin; Wenhao Zhou; Hyewon Shim; Shin-Young Chung (IRPS, 2023)

Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. - SungMan Rhee; Hyunjin Kim; Sangku Park; Taiki Uemura; Yuchul Hwang; Seungjin Choo; Jinju Kim; Hwasung Rhee; Shin-Young Chung (IRPS, 2023)

Polarity Dependency of MOL-TDDB in FinFET. - Manisha Sharma; Hokyung Park; Yinghong Zhao; Ki-Don Lee; Liangshan Chen; Joonah Yoon; Rakesh Ranjan; Caleb Dongkyan Kwon; Hyewon Shim; Myungsoo Yeo; Shin-Young Chung; Jon Haefner (IRPS, 2023)

Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. - Taiki Uemura; Byungjin Chung; Shin-Young Chung; Seungbae Lee; Yuchul Hwang; Sangwoo Pae (IRPS, 2023)

An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology. - Sangmin Oh; Taeyoung Jeong; Junghwan Yum; Minhyuk Lim; Yoohwan Kim; Bongyong Jeong; Jeongmin Jo; Hyewon Shim; Shin-Young Chung; Paul Jung (IRPS, 2024)

A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation. - Rakesh Ranjan; Pavitra R. Perepa; Ki-Don Lee; Ashish Kumar Jha 005; Kartika Chandra Sahoo; Kayla N. Sanders; Robert Moeller; Prateek Sharma; Minhyo Kang; Peter Kim; Kwanjae Song; Yongwoo Jeon; et al. (IRPS, 2024)

Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology. - Taiki Uemura; Byungjin Chung; Jaehee Choi; Seungbae Lee; Shin-Young Chung; Yuchul Hwang; Sangwoo Pae (IRPS, 2024)

Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence. - Taiki Uemura; Byungjin Chung; Jaehee Choi; Seungbae Lee; Shin-Young Chung; Yuchul Hwang; Sangwoo Pae (IRPS, 2024)

Impacts of Post-Cu CMP Queue Time on Reliability. - Yinghong Zhao; Hokyung Park; Ki-Don Lee; Liangshan Chen; Manisha Sharma; Sugento Huandra; Hanson Mao; Brian Filemyr Smith; Wei Xia; Joonah Yoon; Junehwan Kim; Myungsoo Yeo; et al. (IRPS, 2024)

Hot-Carrier-Degradation Characterization for Accurate End-of-Life Prediction with 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FET. - Seongkyung Kim; Junkyo Jeong; Eunyu Choi; Jinyoung Kim; Hyewon Shim; Shin-Young Chung; Paul Jung (VLSI Technology and Circuits, 2024)

Reliability Impacts of Tapered Nanosheets and Localized Layout Effects in MBCFETs Fabricated with 2NM Logic Technology Featuring GAA. - Seongkyung Kim; Eunyu Choi; Jinyoung Kim; Junkyo Jeong; Jihun Ryu; Myungsoo Yeo; Taiki Uemura; Shin-Young Chung; Jong-Ho Lee (IRPS, 2025)

Introduction to Voltage-Ramping Wafer Level Electromigration Method and Current Exponent Correction Factor for Co-Capping Metal Lines. - Da Yong Shin; Hyunjun Choi; Joosung Kim; Myungsoo Yeo; Miji Lee; Taiki Uemura; Shin-Young Chung; Jong-Ho Lee (IRPS, 2025)