Note on Fast Bridge Fault Test Generation Based on Critical Area. - Masayuki Arai; Shingo Inuyama; Kazuhiko Iwasaki (ICA3PP (3), 2015)

Critical-Area-Aware Test Pattern Generation and Reordering. - Shingo Inuyama; Masayuki Arai; Kazuhiko Iwasaki (ATS, 2016)

Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation. - Masayuki Arai; Shingo Inuyama; Kazuhiko Iwasaki (ITC, 2017)

Layout-Aware Fast Bridge/Open Test Generation by 2-Step Pattern Reordering. - Masayuki Arai; Shingo Inuyama; Kazuhiko Iwasaki (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2018)