Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)

Reliability of STT-MRAM for various embedded applications. - Shinhee Han; Junghyuk Lee; Kiseok Suh; Kyungtae Nam; Daeeun Jeong; Sechung Oh; Sohee Hwang; Yongsung Ji; Kilho Lee; Kangho Lee; Yoonjong Song; Yeongki Hong; et al. (IRPS, 2021)

A 14nm 128Mb Embedded MRAM Macro achieved the Best Figure-Of-Merit with 80MHz Read operation and 18.1Mb/mm² implementation at 0.64V. - Gyuseong Kang; Hyunjin Shin; Hyuntaek Jung; Sunkyu Lee; Jaeseung Choi 001; Sangyeop Baeck; Hyunsung Jung; Daeshik Kim; Sohee Hwang; Shinhee Han; Yongsung Ji; Sei Seung Yoon (VLSI Technology and Circuits, 2023)

14nm FinFET Node Embedded MRAM Technology for Automotive Non-Volatile RAM Applications with Endurance Over 1E12-Cycles. - Joosung Oh; Jaehyeon Park; Kiseok Suh; Kangmoon Lee; Sohee Hwang; Myeongjun Bak; Honghyun Kim; Baeseong Kwon; DongKyu Lee; Minkwan Kim; Seungmo Noh; Jongmin Lee; et al. (VLSI Technology and Circuits, 2024)

37.3 Monolithic in-Memory Computing Microprocessor for End-to-End DNN Inferencing in MRAM-Embedded 28nm CMOS Technology with 1.1Mb Weight Storage. - Soonwan Kwon; Sungmeen Myung; Jangho An; Hyunsoo Kim; Minjae Kim; Hyungwoo Lee; Wooseok Yi; Seungchul Jung; Daekun Yoon; Shinhee Han; Saeyoon Chung; Kilho Lee; et al. (ISSCC, 2025)