Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory. - Kyunghwan Lee; Duckseoung Kang; Hyungcheol Shin; Sangjin Kwon; Shinhyung Kim; Yuchul Hwang (ESSDERC, 2014)

The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress. - Gang-Jun Kim; Moonjee Yoon; SungHwan Kim; Myeongkyu Eo; Shinhyung Kim; Taehun You; Namhyun Lee; Kijin Kim; Sangwoo Pae (IRPS, 2021)

Development and Verification of a ROS-Based Multi-DOF Flight Test System for Unmanned Aerial Vehicles. - Shinhyung Kim; Opayemi Alaba Philip; Abera Tullu; Sunghun Jung (IEEE Access, 2023)

Linearized State-Space Model-Based Attitude Control for Rocket With Four Controllable Fins - Part 1-1: Basic Modeling and Identification. - Shinhyung Kim; Abera Tullu; Sunghun Jung (IEEE Access, 2023)

Reliability Characterization Using Accelerated Methods of 1Tb 9th-Gen VNAND for TLC/QLC applications. - Gang-Jun Kim; Taehun You; Sewon Jeon; Seung Hwan Kwak; Hwangju Song; Shinhyung Kim; Nam-Jae Kim; Jaeyeop Ahn; Hyuk Park 006; Seonhaeng Lee; Nam-Hyun Lee; Young Hoon Cho; et al. (IRPS, 2025)

Energy-Efficient Control System for Small-Scale Rocket Recovery. - Shinhyung Kim; Tsegaye Molla; Abenezer Zegeye; Sunghun Jung (IEEE Access, 2025)