Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests. - Yasunori Tateno; Ken Nakata; Akio Oya; Keita Matsuda; Yoshihide Komatsu; Shinichi Osada; Masafumi Hirata; Shigeyuki Ishiyama; Toshiki Yoda; Atsushi Nitta; Tomio Sato (IRPS, 2021)