Analysis and Definition of Overall Timing Accuracy in VLSI Test System. - Shigeru Sugamori; Kenji Yoshida; Hiromi Maruyama; Shinpei Kamata; Tsuneta Sudo (ITC, 1981)

Testing VLSI Microprocessor with New Functional Capability. - Junji Nishiura; Toshio Maruyama; Hiromi Maruyama; Shinpei Kamata (ITC, 1982)

Tester Correlation Problem in Memory Testers Used in Production Lines. - Masaaki Arao; Takao Tadokoro; Hiromi Maruyama; Shinpei Kamata (ITC, 1983)

High-Fidelity Device Tester Interface. - Shigeru Sugamori; Kunio Takeuchi; Hiromi Maruyama; Shinpei Kamata (ITC, 1983)