Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy. - Norimich Chinone; Ryoji Kosugi; Yasunori Tanaka; Shinsuke Harada; Hajime Okumura; Yasuo Cho (Microelectron. Reliab., 2016)

An experimental study on dynamic junction temperature estimation of SiC MOSFET with built-in SBD. - Shuhei Fukunaga; Tsuyoshi Funaki; Shinsuke Harada; Yusuke Kobayashi (IEICE Electron. Express, 2019)

High-speed switching operation for a SiC CMOS and power module. - Atsushi Yao; Mitsuo Okamoto; Fumiki Kato; Hiroshi Hozoji; Shinji Sato; Shinsuke Harada; Hiroshi Sato (IEICE Electron. Express, 2021)