Summary of Test Training Network. - Shipeng Gu; Ming Liu; Yaping Ma (CONF-CDS, 2021)

Random Flip Bit Aware Reading for Improving High-Density 3-D NAND Flash Performance. - Hua Feng; Debao Wei; Shipeng Gu; Zhelong Piao; Yongchao Wang; Liyan Qiao (IEEE Trans. Circuits Syst. I Regul. Pap., 2024)